Testing Services

Standard Products

Diodes, Zeners, Schottky, LEDs                                                     EEPROM, EPROM, PROM

Power transistors, FET, IGBT, BJT, MOSFET                                 ECL, CMOS, TTL

Discretes, capacitors & resistors                                                  Op amps, regulators, mux, switches, ADC, DAC

RFICs, testing to 67GHz (4 channels available)                           Transceivers, receivers

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Lot Acceptance Testing

Die/wafer LAT testing to MIL-PRF-38534, 38535 and 19500 class K & H or to SCD/drawing or given specs

Bond pull / die shear

Hermetic seal fine and gross leak

Group Testing

Group testing per MIL-STD-883 method 5005 & MIL-PRF-38535 A, B, C, & D

Hermeticity - method 1014

Centrifuge - method 2001

Mechanical shock - method 2007

PIND - method 2020

Thermal vacuum testing

Electrical Probing

Wide range of electrical probing from -80C to +220C DC & AC parametric functionality tests. DC to 50 amps and 1000V in wafer or die form, including GaAs & GaN MMICs

Environmentals

Burn-in (static / dynamic), life test, method 1005 MIL-STD-883

RF

IC probing to high RF (67 GHz) s, y, z, abcd parameters

Radiation

RLAT - radiation lot acceptance testing

Total irradiation dose - method 1019.8

HDR 50-300 rad/s

LDR assume 10mrad/s

ELDRS, HDR (high), LDR (low)

SEP & LET linear energy threshold - 100 MeV-cm2/mg

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Upscreening

Upscreening packaged parts for tighter tolerance

SEM & WLAT

Cross section analysis, decap

Programming

PAL, PROM, EPROM programming and testing